X-Ray Diffractometer (XRD)

Brand : Bruker
Model : D8 Advance

  • Identify phases, crystallite size and crystallinity index in
    chemical and material
  • Determination of qualitative and quantitative in crystallization
    material
  • Refinement and determination of unit cell, plane, crystal
    structure and atomic positions

Description

  • 1

    Mineral Phase Identification .

  • 2

    Inorganic Material Phase Identification.

  • 3

    Medication Material Phase Identification.<

  • 4

    Quantitative of Chemical Phase.

  • 5

    Characterisation Unit Cell In Atomic Bonding.

  • 6

    Characterisation of Crystal Phases.

  • 7

    Characterisation of Thin Film Properties Like Phases, Thickness, Stress and Crystal Growth.

  • 1

    Dry Powder

  • 2

    Solid

  • 3

    Thin Film

All enquiries please contact:

MOHD RIDUAN MT SAID

B.Sc., M.Sc. (UKM) Physics

Email : riduan@ukm.edu.my
Contact Number : 03-8911 8509
Location : Level 3, i-CRIM Centralised Lab, Centre for Research and Instrumentation Management (CRIM), Research Complex UKM