Description
The applications of TEM include:
- 1
Provide topographical, morphological, compositional and crystalline information.
- 2
View samples at a molecular level, making it possible to analyse structure and texture.
- 3
Semiconductor analysis and production and the manufacturing of computer and silicon chips.
- 4
Identify flaws, fractures and damages to micro-sized objects; this data can help fix problems and/or help to make a more durable, efficient product.
- 1
Powder
- 2
Film
- 3
Solid
- 4
Dry
All enquiries please contact:
Ts. MOHD NOORSYAKIR SAIPOL YAZAN
B.Eng. (UTHM) Mechanical Engineering
Email : mnsyakir@ukm.edu.my
Contact Number : 03-8911 8508
Location : Level 3, i-CRIM Centralised Lab, Centre for Research and Instrumentation Management (CRIM), Research Complex UKM
Email : mnsyakir@ukm.edu.my
Contact Number : 03-8911 8508
Location : Level 3, i-CRIM Centralised Lab, Centre for Research and Instrumentation Management (CRIM), Research Complex UKM