Scanning Probe Microscope (SPM)

Brand : NT-MDT
Model : NTEGRA Prima
Scanning Type : By sampel & By Probe
Scan Range : 100 μm – 1 A

Scanning Probe Microscope (NTEGRA Prima) is capable in performing more than 40 measuring methods, which allows to analyse physical properties of the surface with high precision and resolution. It is possible to carry out experiments in air and liquid. The new generation electronics provide operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes using high-frequency cantilevers.

There are several scanning types implemented in NTEGRA Prima: scanning by the sample, scanning by the probe and dual-scanning. On account of that, the system is ideal for investigating small samples with ultra-high resolution (atomic-molecular level) as well as for big samples and scanning range up to 100x100x10 μm.

NTEGRA Prima can analyse different characteristic of physical properties of the surface such as in topo mode (topography, roughness, pore size, grain size, thickness), Electrical mode (Spreading resistance, surface potential, electrical, capacitance), Piezorespone, Force curve measurement.

Main Mode NTEGRA Prima

  • Topography AFM (Contact, Semicontact)
  • Topography STM (Scanning Tunneling Microscope)
  • Spreading Resistance (SSRM)
  • Kelvin Probe (KPM)
  • Capacitance Microscope (SCM)
  • Electrostatic Microscope (EFM AC/DC)
  • Magnetic Force Microscope (MFM)
  • Piezoresopne (PFM)
  • Force Distance Curve
  • Lithography
Category:

Description

Applications

Type
Biology and Biotechnology Proteins, DNA, viruses, bacteria, tissues
Materials Science Surface morphology, local piezoelectric properties, local adhesion properties, local tribological properties, surface potential
Magnetic materials Magnetic domain structure visualization, observation of magnetization reversal processes that depend on external magnetic field, observation of magnetization reversal processes under different temperatures
Semiconductors, electric measurements Wafers and other structures morphology, local surface potential and capacitance measurements, electric domain structure imaging, determination of heterojunction bounds and semiconductor regions with different doping levels, failure analysis (localization of conductor line failure and leakage in dielectric layers)
Polymers and Thin Organic Films Spherulites and dendrites, polymer monocrystals, polymer nanoparticles, LB-films, thin organic films
Data storage devices and medias CD, DVD disks, storages for terabit memories with thermomechanical, electric and other types of recording
Nanostructures Fullerenes, nanotubes, nanofilaments, nanocapsules
Nanoelectronics Quantum dots, nanowires, quantum structures
Nanomachining AFM lithography: force (ac and dc), current (Local anodic oxidation), STM lithography
Sample Requirements
• Solid
• Dry sample

Additional information

Name

MUHAMMAD NAZRUL ZAHARI
Diploma (UiTM) Industrial Chemistry

Email

nazrul87@ukm.edu.my

Contact Number

03-8911 8512