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Chemical Structure Analysis
- Molecular structure analysis
- Functional groups and chemical bonds analyses
- ew mineral identification
- Fourier Transform Nuclear Magnetic Resonance (FT-NMR 400 Mhz)
- Fourier Transform Nuclear Magnetic Resonance (FT-NMR 600MHz)
- Single Crystal X-Ray Diffractometer (SC-XRD)
- Fourier Transform Infrared Spectrometer (FTIR)
Failure and Thermal Analysis
- Sample thickness analysis
- Material quality analysis
- Impurity and defect analysis
- Thermal analysis of material
- Raman Spectrometer (RAMAN)
- Photoluminescence Spectrometer (PL)
- Laser Particle Size Analyzer (LPSA)
- Nano Particle Size Analyzer (NPSA)
- Simultaneous Thermal Analyzer (STA)
- Thermogravimetric Analyzer (TGA)
- Differential Scanning Calorimeter (DSC)
- Triple Focused Ion Beam-SEM (FIB-SEM)
Life Science and Natural Product Analyses
- Volatile and non-volatile sample analyses (biochemical, organic, and inorganic compounds)
- Food, beverages, flavour, and fragrance analyses
- Colour and food constituent analyses
- High-Performance Liquid Chromatography (HPLC)
- Gas Chromatography Mass Spectrometer (GC-MS)
- Automatic Polarimeter (POL)
- Ultraviolet Visible Near Infrared Spectrometer (UV-VIS-NIR)
- Orbitrap Liquid Chromatography Mass Spectrometry (HRMS)
Elemental Analysis
- Inorganic material phase identification
- Material surface layer characterisation
- Chemical element identification
- Trace element analysis
- X-Ray Diffractometer (XRD)
- X-Ray Fluorescence Spectrometer (XRF)
- X-Ray Photoelectron Spectrometer (XPS)
- FESEM- Energy Dispersive Spectrocopy (FESEM-EDS)
- Inductively Coupled Plasma Mass Spectrometer (ICP-MS)
- CHNS/O Elemental Analyzer (CHNS/O)
- FESEM-Micro X-Ray Fluorescence Spectrometer (FESEM-Micro XRF)
Micro-Imaging Analysis
- Cross section analysis
- TEM lamella preparation
- Advanced coating thickness and structure uniformity analyses
- Structure and texture analyses at molecular level
- Transmission Electron Microscope (TEM)
- Field Emission Scanning Electron Microscope (FESEM)
- Scanning Probe Microscope (SPM)
- Atomic Force Microscope (AFM)
- FESEM-Micro X-Ray Fluorescence Spectrometer (FESEM-Micro XRF)
- Triple Focused Ion Beam-SEM (FIB-SEM)
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