Institute of Microengineering and Nanoelectronics

 Institute of Microengineering and Nanoelectronics

MIPAC Characterization

Equipments :

  1. UNIVERSAL TESTING MACHINE 5564 (INSTRON)
  2. DYNAMIC MICROTESTING MACHINE 5848 (INSTRON)
  3. CT SCAN X-RAY IMAGING SYSTEM HMXCT-160XI (XTEK)
  4. INFINITE FOCUS PROFILOMETER (ALICONA)
  5. NANO INDENTER (MICROMATERIALS)
  6. METALLOGRAPHY MICROSECTIONING (BUEHLER)
  7. THERMAL CYCLE CHAMBER (TPS)
  8. INCUBATOR (SANYO)
  9. TEMPERATURE AND HUMIDITY ENVIRONMENTAL TEST CHAMBER (ESPEC)
  10. TEMPERATURE OVEN (TABAI)
  11. PBC BURN-IN CABINET OVEN (DESPATCH)
  12. SRT SIERRA SUMMIT 1000 (SRT SIERRA)
  13. TEMPERATURE TEST CHAMBER (RANSCO DESPATCH)
  14. IC BACK SIDE POLISHING SYSTEM (HAMAMATSU)
  15. ION SPUTTERING DEVICE (JEOL)
  16. PUSH PULL GAUGE (IMADA)
  17. FATIGUE TESTER MODEL 1500 (HMP)
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